SCOPUS 정보 검색 플랫폼

Volumn 23, Issue 1, 2009, Pages 72-75

Micro-computer tomography-An aid in the investigation of structural changes in lead zirconate titanate ceramics after temperature-humidity bias testing

(4) Lipscomb, I P a Weaver, P M b Swingler, J a McBride, J W a

a UNIVERSITY OF SOUTHAMPTON (United Kingdom)

b Servocell Ltd (United Kingdom)

Author keywords

Breakdown; Lead titanate zirconate; Micro computer tomography; PZT; Temperature humidity bias testing; Voids

Indexed keywords

BIAS TESTING; PZT; TEMPERATURE HUMIDITY; VOIDS; ZIRCONATES;

COMPUTER CRIME; ELECTROMECHANICAL DEVICES; ENVIRONMENTAL TESTING; LEAKAGE CURRENTS; MOISTURE; PIEZOELECTRIC ACTUATORS; PIEZOELECTRIC MATERIALS; PIEZOELECTRIC TRANSDUCERS; SEMICONDUCTING LEAD COMPOUNDS; STRUCTURAL CERAMICS; SULFUR COMPOUNDS; TOMOGRAPHY;

COMPUTER TESTING;

EID: 71449114997 PISSN: 13853449 EISSN: 15738663 Source Type: Journal
DOI: 10.1007/s10832-008-9537-8 Document Type: Article

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