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Journal of Alloys and Compounds

Volumn 527, Issue , 2012, Pages 40-47

Detailed investigation of submicrometer-sized grains of chemically sprayed (Sn 1-xAl x, O 2) (0 ≤ x ≤ 0.085) thin films

(7) Benhaliliba, M a Benouis, C E a Yakuphanoglu, F b Tiburcio Silver, A c Aydin, C b Hamzaoui, S d Mouffak, Z e

a UNIVERSITY OF ORAN (Algeria)

b FIRAT UNIVERSITY (Turkey)

c ITT DIEE (Mexico)

d UNIVERSITÉ DES SCIENCES ET DE LA TECHNOLOGIE D ORAN MOHAMED BOUDIAF (Algeria)

e CALIFORNIA STATE UNIVERSITY (United States)

Author keywords

AFM; Al doping; Physical properties; Spray pyrolysis; Submicrometer structure; Tin oxide

Indexed keywords

AFM; AL-DOPING; ATOMIC FORCE MICROSCOPE (AFM); CRYSTALLINE STRUCTURE; ELECTRICAL RESISTIVITY; FIXED TEMPERATURE; HIGH TRANSPARENCY; MORPHOLOGICAL PROPERTIES; NANO GRAINS; NANOSTRUCTURED FILMS; POLYCRYSTALLINE; PREFERRED ORIENTATIONS; SUBMICROMETER STRUCTURES;

ALUMINUM; ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTIVITY; PHYSICAL PROPERTIES; SEMICONDUCTOR DOPING; SPRAY PYROLYSIS; TIN OXIDES;

TIN;

EID: 84858988480 PISSN: 09258388 EISSN: None Source Type: Journal
DOI: 10.1016/j.jallcom.2012.02.128 Document Type: Article

Times cited : (8)

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