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Journal of Non-Crystalline Solids

Volumn 357, Issue 8-9, 2011, Pages 1888-1891

Study of the absorption edge of SnO2 nanoparticles embedded in silica films

(5) Lorenzi, R a Lauria, A a Mochenova, N a Chiodini, N a Paleari, A a

a UNIVERSITY OF MILANO BICOCCA (Italy)

Author keywords

Absorption edge; Nanostructures; Silica film; Sol gel; Wide band gap semiconductor

Indexed keywords

ABSORPTION EDGES; BULK SAMPLES; CASSITERITE STRUCTURE; MEAN SIZE; NANO-STRUCTURING; NEAR ULTRAVIOLET; OPTICAL ABSORPTION SPECTROSCOPY; QUANTUM CONFINEMENT EFFECTS; SILICA FILM; SILICA THIN FILMS; SINTERING CONDITION; SOL-GEL METHODS; TRANSPARENT SUBSTRATE; VISIBLE RANGE; WIDE BAND GAP; WIDE-BAND-GAP SEMICONDUCTOR;

ABSORPTION; CRYSTAL STRUCTURE; CRYSTALLITE SIZE; ENERGY GAP; GELS; NANOPARTICLES; SILICA; SINTERING; SOL-GEL PROCESS; SOL-GELS; SOLS; TIN; TIN DIOXIDE; TRANSMISSION ELECTRON MICROSCOPY;

ABSORPTION SPECTROSCOPY;

EID: 79955468134 PISSN: 00223093 EISSN: None Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2010.12.045 Document Type: Conference Paper

Times cited : (6)

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