SCOPUS 정보 검색 플랫폼

Materials Letters

Volumn 65, Issue 8, 2011, Pages 1204-1206

The FTIR studies of SnO2:Sb(ATO) films deposited by spray pyrolysis

(4) Zhang, B a,b Tian, Y b Zhang, J X a,b Cai, W a

a HARBIN INSTITUTE OF TECHNOLOGY (China)

b SHANDONG UNIVERSITY (China)

Author keywords

Defects; FTIR; Reflectivity; Structural; Thin films

Indexed keywords

CARRIER SCATTERING; FT-IR STUDY; FTIR; IONIZED IMPURITIES; NEUTRAL IMPURITY SCATTERING; REFLECTIVITY; SB FILMS; SCATTERING MECHANISMS; STRUCTURAL; ULTRASONIC SPRAY PYROLYSIS METHOD;

CARRIER CONCENTRATION; CONCENTRATION (PROCESS); DEFECTS; REFLECTION; SCATTERING; THIN FILMS; TIN;

SPRAY PYROLYSIS;

EID: 79952448992 PISSN: 0167577X EISSN: None Source Type: Journal
DOI: 10.1016/j.matlet.2011.01.052 Document Type: Article

Times cited : (58)

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