Microstructural study of SnO2 thin layers deposited on sapphire by sol-gel dip-coating

Thin Solid Films

Volumn 518, Issue 1, 2009, Pages 1-5

  Hamd, W ^a   Wu, Y C ^a   Boulle, A ^a   Thune, E ^a   Guinebretiere R ^a  

^a UNIVERSITY OF LIMOGES   (France)

Author keywords

Annealing; Atomic force microscopy; Microstructure; Sol gel deposition; Tin oxide; X ray diffraction

Indexed keywords

ALKOXIDE SOLUTIONS; ANNEALING TREATMENTS; EVAPORATION-CONDENSATION; FIBRE TEXTURE; GRAZING INCIDENCE X-RAY DIFFRACTION; HIGHER TEMPERATURES; ISOLATED ISLANDS; MICRO-STRUCTURAL; RECIPROCAL SPACE MAPPING; SAPPHIRE SUBSTRATES; SOL GEL DIP COATING; SOL-GEL DEPOSITION; THERMAL-ANNEALING; THIN LAYERS;

ANNEALING; ATOMIC FORCE MICROSCOPY; ATOMS; CORUNDUM; DIFFRACTION; FILM GROWTH; GELATION; GELS; GRAIN SIZE AND SHAPE; MICROSTRUCTURE; OXIDE MINERALS; SAPPHIRE; SOL-GEL PROCESS; SOL-GELS; SOLS; SURFACE DIFFUSION; TIN; TIN OXIDES; TITANIUM OXIDES; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

GRAIN GROWTH;

EID: 69549090015     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.05.053     Document Type: Article

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