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Volumn 21, Issue 6, 2010, Pages 578-583
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Structural, optical and electrical studies on nanocrystalline tin oxide (SnO 2) thin films by electron beam evaporation technique
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Author keywords
[No Author keywords available]
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Indexed keywords
ABSORPTION COEFFICIENTS;
ANNEALED FILMS;
ANNEALING TEMPERATURES;
ELECTRICAL STUDIES;
ELECTRON BEAM EVAPORATION;
GLASS SUBSTRATES;
MORPHOLOGICAL CHANGES;
NANOCRYSTALLINES;
OPTICAL BANDS;
OPTICAL STUDY;
PHOTON ENERGY;
POLYCRYSTALLINE;
SHORT WAVELENGTHS;
TETRAGONAL STRUCTURE;
XRD ANALYSIS;
XRD PATTERNS;
AMORPHOUS FILMS;
ANNEALING;
ATOMIC FORCE MICROSCOPY;
CRYSTALLITE SIZE;
ELECTRON BEAMS;
EVAPORATION;
NANOCRYSTALLINE ALLOYS;
SUBSTRATES;
SURFACE STRUCTURE;
THIN FILMS;
TIN;
TITANIUM COMPOUNDS;
VAPOR DEPOSITION;
X RAY DIFFRACTION;
OPTICAL FILMS;
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EID: 77955563885
PISSN: 09574522
EISSN: 1573482X
Source Type: Journal
DOI: 10.1007/s10854-009-9960-x Document Type: Article |
Times cited : (37)
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References (20)
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