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Volumn 21, Issue 6, 2010, Pages 578-583

Structural, optical and electrical studies on nanocrystalline tin oxide (SnO 2) thin films by electron beam evaporation technique

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION COEFFICIENTS; ANNEALED FILMS; ANNEALING TEMPERATURES; ELECTRICAL STUDIES; ELECTRON BEAM EVAPORATION; GLASS SUBSTRATES; MORPHOLOGICAL CHANGES; NANOCRYSTALLINES; OPTICAL BANDS; OPTICAL STUDY; PHOTON ENERGY; POLYCRYSTALLINE; SHORT WAVELENGTHS; TETRAGONAL STRUCTURE; XRD ANALYSIS; XRD PATTERNS;

EID: 77955563885     PISSN: 09574522     EISSN: 1573482X     Source Type: Journal    
DOI: 10.1007/s10854-009-9960-x     Document Type: Article
Times cited : (37)

References (20)
  • 17
    • 0003443049 scopus 로고
    • J. I. Pankove ed., Prentice-Hall, Englewood Cliffs
    • J. I. Pankove (ed.), Optical Processes in Semiconductors (Prentice-Hall, Englewood Cliffs, 1971)
    • (1971) Optical Processes in Semiconductors


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.