Microstructural investigation and SnO nanodefects in spray-pyrolyzed SnO2 thin films

Materials Letters

Volumn 65, Issue 17-18, 2011, Pages 2610-2613

  Thanachayanont, Chanchana ^a   Yordsri, Visittapong ^a   Boothroyd, Chris ^b  

^a NATIONAL METAL AND MATERIALS TECHNOLOGY CENTER   (Thailand)

^b TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

Nanodefect TEM CBED; SnO; Spray pyrolysis

Indexed keywords

COST EFFECTIVENESS; CRYSTAL MICROSTRUCTURE; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; GRAIN SIZE AND SHAPE; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; LANTHANUM COMPOUNDS; MICROSTRUCTURE; PYROLYSIS; SCANNING ELECTRON MICROSCOPY; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

CONVERGENT BEAM ELECTRON DIFFRACTION (CBED); COST-EFFECTIVE METHODS; FABRICATION COST; LARGE GRAIN SIZES; LOW DEPOSITION TEMPERATURE; MICROSTRUCTURAL INVESTIGATION; NANODEFECT TEM CBED; VERTICALLY ALIGNED;

SPRAY PYROLYSIS;

EID: 79959548058     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2011.05.071     Document Type: Article

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