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Physical Review B - Condensed Matter and Materials Physics

Volumn 85, Issue 10, 2012, Pages

In situ observation of the indentation-induced phase transformation of silicon thin films

(4) Gerbig, Y B a Michaels, C A a Forster, A M a Cook, R F a

a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84858037395 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.85.104102 Document Type: Article

Times cited : (61)

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