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Physical Review B - Condensed Matter and Materials Physics

Volumn 83, Issue 20, 2011, Pages

Direct observation of phase transformation anisotropy in indented silicon studied by confocal Raman spectroscopy

(3) Gerbig, Yvonne B a Stranick, Stephan J a Cook, Robert F a

a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 79961238888 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.83.205209 Document Type: Article

Times cited : (33)

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