High-resolution transmission electron microscopy study of metastable silicon phases produced by nanoindentation

Journal of Applied Physics

Volumn 93, Issue 5, 2003, Pages 2418-2423

  Ge, Daibin ^a   Domnich, Vladislav ^a   Gogotsi, Yury ^a  

^a Drexel University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH RESOLUTION ELECTRON MICROSCOPY; NANOSTRUCTURED MATERIALS; PHASE TRANSITIONS; RAMAN SCATTERING; TRANSMISSION ELECTRON MICROSCOPY;

NANOINDENTATION;

SEMICONDUCTING SILICON;

EID: 0037347946     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1539916     Document Type: Article

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