Examining pressure-induced phase transformations in silicon by spherical indentation and Raman spectroscopy: A statistical study

Journal of Materials Research

Volumn 19, Issue 10, 2004, Pages 3099-3108

  Juliano, Tom ^a   Domnich, Vladislav ^a   Gogotsi, Yury ^a  

^a Drexel University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INDENTATION; PHASE TRANSITIONS; RAMAN SPECTROSCOPY; SHEAR STRESS; SINGLE CRYSTALS; STATISTICAL METHODS;

BERKOVICH INDENTATION; PRESSURE INDUCED PHASE TRANSFORMATION; SPHERICAL INDENTATION;

SILICON WAFERS;

EID: 6344256622     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2004.0403     Document Type: Article

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