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Volumn 1146, Issue , 2008, Pages 1-6

In-situ electrical probing of zones of nanoindentation-induced phases of silicon

Author keywords

[No Author keywords available]

Indexed keywords

NANOINDENTATION; NANOTECHNOLOGY; UNLOADING;

EID: 77950464407     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-1146-nn02-06     Document Type: Conference Paper
Times cited : (2)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.