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Volumn 16, Issue 5, 2001, Pages 1500-1507
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Mechanical deformation in silicon by micro-indentation
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
DEFORMATION;
HYDROSTATIC PRESSURE;
INDENTATION;
LOADS (FORCES);
MICROSTRUCTURE;
NUCLEATION;
RAMAN SPECTROSCOPY;
SHEAR STRESS;
SILICON;
TRANSMISSION ELECTRON MICROSCOPY;
CROSS-SECTIONAL TRANSMISSION ELECTRON MICROSCOPY (XTEM);
CRYSTALLINE MATERIALS;
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EID: 0035352065
PISSN: 08842914
EISSN: None
Source Type: Journal
DOI: 10.1557/JMR.2001.0209 Document Type: Article |
Times cited : (249)
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References (27)
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