High energy transmission micro-beam Laue synchrotron X-ray diffraction

Materials Letters

Volumn 64, Issue 11, 2010, Pages 1302-1305

  Hofmann, F ^a   Song, X ^a   Jun, T S ^a   Abbey, B ^a   Peel, M ^b   Daniels, J ^c   Honkimaki V ^d   Korsunsky, A M ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b UNIVERSITY OF BRISTOL   (United Kingdom)

^c UNIVERSITY OF NEW SOUTH WALES   (Australia)

^d EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Lattice orientation; Micro beam Laue diffraction; Microstructure; Nickel; Polychromatic diffraction; X ray techniques

Indexed keywords

LATTICE ORIENTATIONS; LAUE DIFFRACTION; MICRO BEAMS; POLYCHROMATIC DIFFRACTION; X-RAY TECHNIQUES;

MICROSTRUCTURE; NICKEL ALLOYS; PHOTONS; X RAY DIFFRACTION;

SYNCHROTRONS;

EID: 77950516564     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2010.03.014     Document Type: Article

References (29)

1. Barabash R., Ice G.E., Larson B.C., Pharr G.M., Chung K.S., and Yang W. White microbeam diffraction from distorted crystals. Appl Phys Lett 79 (2001) 749
2. Barabash R.I., Ice G.E., and Walker F.J. Quantitative microdiffraction from deformed crystals with unpaired dislocations and dislocation walls. J Appl Phys 93 (2003) 1457
3. Barabash R.I., Ice G.E., and Pang J.W.L. Gradients of geometrically necessary dislocations from white beam microdiffraction. Mater Sci Eng A 400-401 (2005) 125
4. Mimura H, Handa S, Kimura T, Yumoto H, Yamakawa D, Yokoyama H, et al. Breaking the 10 nm barrier in hard-X-ray focusing. Nat Phys 2009; advance online publication.
5. Budai J.D., Yang W., Tamura N., Chung J.-S., Tischler J.Z., Larson B.C., et al. X-ray microdiffraction study of growth modes and crystallographic tilts in oxide films on metal substrates. Nat Mater 2 (2003) 487
6. Yan H., and Noyan I.C. Dynamical diffraction artifacts in Laue microdiffraction images. J Appl Phys 98 (2005) 073527
7. Hofmann F., Song X., Dolbnya I., Abbey B., and Korsunsky A.M. Probing intra-granular deformation by micro-beam Laue diffraction. Procedia Eng 1 (2009) 193
8. Tamura N., MacDowell A.A., Spolenak R., Valek B.C., Bravman J.C., Brown W.L., et al. Scanning X-ray microdiffraction with submicrometer white beam for strain/stress and orientation mapping in thin films. J Synchrotron Radiat 10 (2003) 137
9. Spolenak R., Brown W.L., Tamura N., MacDowell A.A., Celestre R.S., Padmore H.A., et al. Local plasticity of Al thin films as revealed by X-ray microdiffraction. Phys Rev Lett 90 (2003) 096102
10. Choi W.J., Lee T.Y., Tu K.N., Tamura N., Celestre R.S., MacDowell A.A., et al. Tin whiskers studied by synchrotron radiation scanning X-ray micro-diffraction. Acta Mater 51 (2003) 6253
11. Choi W.J., Lee T.Y., Tu K.N., Tamura N., Celestre R.S., MacDowell A.A., et al. Structure and kinetics of Sn whisker growth on Pb-free solder finish. Electron Comp Technol Conf (2002)
12. Barabash R.I., Ice G.E., Tamura N., Valek B.C., Bravman J.C., Spolenak R., et al. Quantitative characterization of electromigration-induced plastic deformation in Al(0.5 wt%Cu) interconnect. Microelectron Eng 75 (2004) 24
13. Maaß R., Van Petegem S., Zimmermann J., Borca C.N., and Van Swygenhoven H. On the initial microstructure of metallic micropillars. Scripta Mater 59 (2008) 471
14. Maass R., Van Petegem S., Grolimund D., Van Swygenhoven H., Kiener D., and Dehm G. Crystal rotation in Cu single crystal micropillars: in situ Laue and electron backscatter diffraction. Appl Phys Lett 92 (2008) 071905
15. Yang W., Larson B.C., Tischler J.Z., Ice G.E., Budai J.D., and Liu W. Differential-aperture X-ray structural microscopy: a submicron-resolution three-dimensional probe of local microstructure and strain. Micron 35 (2004) 431
16. Larson B.C., Yang W., Tischler J.Z., Ice G.E., Budai J.D., Liu W., et al. Micron-resolution 3-D measurement of local orientations near a grain-boundary in plane-strained aluminum using X-ray microbeams. Int J Plast 20 (2004) 543
17. Barabash R., Barabash O.M., Ice G.E., David S.A., Feng Z., and Horton Jr. J.A. X-ray microbeam characterization of the near surface nanostructure layer in Ti after Friction stir processing. Rev Adv Mater Sci 15 1 (2007) 49
18. Bei H., Barabash R.I., Ice G.E., Liu W., Tischler J., and George E.P. Spatially resolved strain measurements in Mo-alloy micropillars by differential aperture X-ray microscopy. Appl Phys Lett 93 (2008) 071904
19. Ice G.E., Larson B.C., Yang W., Budai J.D., Tischler J.Z., Pang J.W.L., et al. Polychromatic X-ray microdiffraction studies of mesoscale structure and dynamics. J Synchrotron Radiat 12 (2005) 155
20. Poulsen H.F., Nielsen S.F., Lauridsen E.M., Schmidt S., Suter R.M., Lienert U., et al. Three-dimensional maps of grain boundaries and the stress state of individual grains in polycrystals and powders. J Appl Crystallogr 34 (2001) 751
21. Fu X., Poulsen H.F., Schmidt S., Nielsen S.F., Lauridsen E.M., and Juul Jensen D. Non-destructive mapping of grains in three dimensions. Scripta Mater 49 (2003) 1093
22. West S.S., Schmidt S., Sørensen H.O., Winther G., Poulsen H.F., Margulies L., et al. Direct non-destructive observation of bulk nucleation in 30% deformed aluminum. Scripta Mater 61 (2009) 875
23. Hannesson K., and Jensen D.J. Three dimensional characterization of grain structures by EBSP and 3DXRD. Mater Sci Forum 558/559 (2007) 751
24. Wanner A., and Dunand D. Synchrotron X-ray study of bulk lattice strains in externally loaded Cu-Mo composites. Metall Mater Trans A 31 (2000) 2949
25. Cheng S., Stoica A.D., Wang X.L., Ren Y., Almer J., Horton J.A., et al. Deformation crossover: from nano- to mesoscale. Phys Rev Lett 103 (2009) 035502
26. Korsunsky A.M., Collins S.P., Owen R.A., Daymond M.R., Achtioui S., and James K.E. Fast residual stress mapping using energy-dispersive synchrotron X-ray diffraction on station 16.3 at the SRS. J Synchrotron Radiat 9 (2002) 77
27. Steuwer A., Santisteban J.R., Turski M., Withers P.J., and Buslaps T. High-resolution strain mapping in bulk samples using full-profile analysis of energy dispersive synchrotron X-ray diffraction data. Nucl Instrum Meth Phys Res B 238 (2005) 200
28. Tamura N., Celestre R.S., MacDowell A.A., Padmore H.A., Spolenak R., Valek B.C., et al. Submicron X-ray diffraction and its applications to problems in materials and environmental science. Papers from the 12th National Synchrotron Radiation Instrumentation Conference, vol. 73 (2002), AIP, Madison, Wisconsin (USA) 1369
29. Hielscher R., and Schaeben H. A novel pole figure inversion method: specification of the MTEX algorithm. J Appl Crystallogr 41 (2008) 1024