Dynamical diffraction artifacts in Laue microdiffraction images

Journal of Applied Physics

Volumn 98, Issue 7, 2005, Pages

  Yan, Hanfei ^a   Noyan, I C ^a  

^a Columbia University ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BACK-REFLECTION IMAGES; EPITAXIAL THIN FILMS; HIGHER-ENERGY REFLECTIONS; LAUE MICRODIFFRACTION;

CRYSTALS; DIFFRACTION; EPITAXIAL GROWTH; SEMICONDUCTOR MATERIALS; SEPARATION; SINGLE CRYSTALS; THIN FILMS; X RAY ANALYSIS;

IMAGE ANALYSIS;

EID: 27144543552     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2071454     Document Type: Article

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