Model-based electron microscopy: From images toward precise numbers for unknown structure parameters

Micron

Volumn 43, Issue 4, 2012, Pages 509-515

  Van Aert, S ^a   Van den Broek, W ^a   Goos, P ^a,b   Van Dyck, D ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b ERASMUS UNIVERSITY ROTTERDAM   (Netherlands)

Author keywords

Quantitative atomic resolution transmission electron microscopy; Statistical experimental design; Statistical parameter estimation

Indexed keywords

ATOMIC COLUMNS; ATOMIC NUMBERS; DATA PLANES; ELECTRON MICROSCOPY IMAGES; ESTIMATION THEORY; HIGH-ANGLE ANNULAR DARK FIELDS; ORDERS OF MAGNITUDE; PARAMETRIC MODELS; PROBE SIZE; RADIUS MEASUREMENTS; SIGNAL TO NOISE; STATISTICAL EXPERIMENTAL DESIGN; STATISTICAL PARAMETERS; STRUCTURE PARAMETER;

OPTIMIZATION; PARAMETER ESTIMATION; PROBES; STATISTICS; TRANSMISSION ELECTRON MICROSCOPY;

ATOMS;

EID: 84857355772     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2011.10.019     Document Type: Article

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