Effect of amorphous layers on the interpretation of restored exit waves

Ultramicroscopy

Volumn 109, Issue 3, 2009, Pages 237-246

  Aert, S Van ^a   Chang, L Y ^b   Bals, S ^a   Kirkland, A I ^b   Tendeloo, G Van ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Exit wave restoration; High resolution transmission electron microscopy (HRTEM); Model based fitting

Indexed keywords

AMORPHOUS CARBON LAYERS; AMORPHOUS LAYERS; ATOMIC COLUMNS; EXIT WAVE RESTORATION; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY (HRTEM); MODEL-BASED FITTING; QUANTITATIVE MEASUREMENTS; SOFTWARE IMPLEMENTATIONS;

AMORPHOUS CARBON; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; HIGH RESOLUTION ELECTRON MICROSCOPY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; POSITION MEASUREMENT; REPAIR; TRANSMISSION ELECTRON MICROSCOPY;

RESTORATION;

EID: 59649111086     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2008.10.024     Document Type: Article

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