Understanding temperature acceleration for NBTI

Technical Digest - International Electron Devices Meeting, IEDM

Volumn , Issue , 2011, Pages

  Pobegen, Gregor ^a,d   Aichinger, Thomas ^b   Nelhiebel, Michael ^c   Grasser, Tibor ^d  

^a Kompetenzzentrum Automobil und Industrie Elektronik Gmbh   (Austria)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

^c INFINEON TECHNOLOGIES AUSTRIA AG   (Austria)

^d INSTITUTE FOR MICROELECTRONICS   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE EXCHANGES; DEGRADATION DATA; MULTIPHONON PROCESS; NON-RADIATIVE; TEMPERATURE DEPENDENT;

CHARGE TRANSFER; DEGRADATION;

ELECTRON DEVICES;

EID: 84857020277     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.2011.6131623     Document Type: Conference Paper

References (17)

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