Statistical characterization of trap position, energy, amplitude and time constants by RTN measurement of multiple individual traps

Technical Digest - International Electron Devices Meeting, IEDM

Volumn , Issue , 2010, Pages

  Nagumo, Toshiharu ^a   Takeuchi, Kiyoshi ^a   Hase, Takashi ^a   Hayashi, Yoshihiro ^a  

^a RENESAS TECHNOLOGY CORP   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELASTIC TUNNELING; ENERGY SPACES; RANDOM TELEGRAPH NOISE; STATISTICAL CHARACTERIZATION; TIME CONSTANTS; TRAP POSITIONS;

TELEGRAPH;

ELECTRON DEVICES;

EID: 79951847514     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.2010.5703437     Document Type: Conference Paper

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