A reliable and accurate approach to assess NBTI behavior of state-of-the-art pMOSFETs with fast-WLR

ESSDERC 2007 - Proceedings of the 37th European Solid-State Device Research Conference

Volumn 2007, Issue , 2007, Pages 131-134

  Schlünder, Christian ^a   Vollertsen, Rolf Peter ^a   Gustin, Wolfgang ^a   Reisinger, Hans ^a  

^a INFINEON TECHNOLOGIES AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

PROBLEM SOLVING; PROCESS MONITORING; STRESS MEASUREMENT; THERMODYNAMIC STABILITY;

NBTI; OTF; PMOSFETS; WLR;

MOSFET DEVICES;

EID: 39549109784     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSDERC.2007.4430896     Document Type: Conference Paper

References (12)

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