Unambiguous identification of the NBTI recovery mechanism using ultra-fast temperature changes

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2009, Pages 2-7

  Aichinger, Thomas ^a   Nelhiebel, Michael ^b   Grasser, Tibor ^c  

^a Kompetenzzentrum für Automobil und Industrieelektronik ^*  (Austria)

^b INFINEON TECHNOLOGIES AUSTRIA AG   (Austria)

^c VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

Charge pumping; Interface states; NBTI recovery; Oxide traps; Polyheater

Indexed keywords

CHARGE PUMPING; INTERFACE STATES; NBTI RECOVERY; OXIDE TRAPS; POLYHEATER;

EXPERIMENTS; NEGATIVE TEMPERATURE COEFFICIENT; PUMPS; THERMODYNAMIC STABILITY;

RECOVERY;

EID: 70449106127     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IRPS.2009.5173216     Document Type: Conference Paper

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