Negative bias temperature instability (NBTI) recovery with bake

Microelectronics Reliability

Volumn 48, Issue 10, 2008, Pages 1655-1659

  Katsetos, Anastasios A ^a  

^a IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION; FIELD EFFECT TRANSISTORS; THERMODYNAMIC STABILITY;

ELEVATED TEMPERATURES; NEGATIVE BIAS- TEMPERATURE-INSTABILITY; P-CHANNEL;

NEGATIVE TEMPERATURE COEFFICIENT;

EID: 50949120239     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2008.04.012     Document Type: Article

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