Temperature dependence of optical and structural properties of ferroelectric B 3.15Nd 0.85Ti 3O 12 thin film derived by sol-gel process

Journal of Sol-Gel Science and Technology

Volumn 61, Issue 1, 2012, Pages 236-242

  Zang, Yongyuan ^a   Xie, Dan ^b,c   Chen, Yu ^b   Li, Mohan ^a   Chen, Chen ^a   Ren, Tianling ^b   Plant, David ^a  

^a MCGILL UNIVERSITY   (Canada)

^b TSINGHUA UNIVERSITY   (China)

^c UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

BNdT thin film; Ferroelectrics; Optical properties; Sol gel process

Indexed keywords

ANNEALING TEMPERATURES; BAND GAP ENERGY; C-AXIS ORIENTATIONS; COATING METHODS; COERCIVE FIELD; CRYSTALLINE STRUCTURE; DIFFERENT THICKNESS; ELLIPSOMETRY MEASUREMENTS; EXTINCTION COEFFICIENTS; FATIGUE DEGRADATION; FATIGUE ENDURANCES; OPTICAL PARAMETER; OPTICAL TRANSPARENCY; SWITCHING CYCLES; TEMPERATURE DEPENDENCE;

ANNEALING; ATOMIC FORCE MICROSCOPY; ELECTRIC FIELDS; FERROELECTRIC MATERIALS; FERROELECTRICITY; GELS; NEODYMIUM; OPTICAL PROPERTIES; PEROVSKITE; POLARIZATION; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SOL-GEL PROCESS; SOL-GELS; SOLS; TEMPERATURE DISTRIBUTION; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

OPTICAL FILMS;

EID: 84856214554     PISSN: 09280707     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10971-011-2619-0     Document Type: Article

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