Variations of optical properties with phase co-existence in PZT thin films

Ferroelectrics

Volumn 370, Issue 1 PART 4, 2008, Pages 46-56

  Puustinen, J ^a   Lappalainen, J ^a   Hiltunen, J ^b   Lantto, V ^a  

^a UNIVERSITY OF OULU   (Finland)

^b VTT TECHNICAL RESEARCH CENTRE OF FINLAND   (Finland)

Author keywords

Morphology; Optical properties; Phase co existence; Thin films

Indexed keywords

AT-WAVELENGTH; CRYSTAL STRUCTURE AND MORPHOLOGY; MGO(1 0 0); OPTICAL CHARACTERIZATION; ORIENTED FILMS; PHASE CO-EXISTENCE; POLYCRYSTALLINE; PZT THIN FILM; ROOM TEMPERATURE; SINGLE PHASE; TEMPERATURE PHASE;

ATOMIC FORCE MICROSCOPY; CRYSTAL ATOMIC STRUCTURE; DEPOSITION; FERROELECTRICITY; LEAD; MORPHOLOGY; PULSED LASER DEPOSITION; PULSED LASERS; THIN FILMS; ZIRCONIUM;

OPTICAL PROPERTIES;

EID: 70350740875     PISSN: 00150193     EISSN: 15635112     Source Type: Journal    
DOI: 10.1080/00150190802384336     Document Type: Conference Paper

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