Orienting ferroelectric films

Science

Volumn 296, Issue 5575, 2002, Pages 1975-1976

  Ramesh, R ^a   Schlom, D G ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

OXIDE; PEROVSKITE; SILICON;

FILM;

CHEMICAL STRUCTURE; CONDUCTOR; CRYSTALLOGRAPHY; DEVICE; ELECTRICITY; ELECTRODE; ELECTRONICS; FILM; GROWTH RATE; MATERIAL STATE; PRIORITY JOURNAL; SHORT SURVEY; STRUCTURE ANALYSIS; TEMPERATURE DEPENDENCE;

EID: 0037076989     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.1072855     Document Type: Short Survey

References (13)