Band alignments of the platinum/SrBi2Ta2O9 interface

Applied Physics Letters

Volumn 71, Issue 23, 1997, Pages 3444-3446

  Gutleben, C D ^a  

^a SONY CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001414362     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120402     Document Type: Article

References (10)

1. C. A. Paz de Araujo, J. D. Cuchiaro, L. M. McMillan, M. C. Scott, and J. F. Scott, Science 374, 627 (1995).
2. J. F. Scott, Integr. Ferroelectr. 9, 1 (1995).
3. J. Robertson, C. W. Chen, W. L. Warren, and C. D. Gutleben, Appl. Phys. Lett. 69, 1704 (1996).
4. A. J. Hartmann, R. N. Lamb, J. F. Scott, and C. D. Gutleben, Integr. Ferroelectr. (in press).
5. M. A. Rodriguez, T. J. Boyle, B. A. Hernandez, C. D. Buchheit, and M. O. Eatough, J. Mater. Res. 11, 2282 (1996).
6. C. D. Gutleben, Mater. Res. Soc. Symp. Proc. 433, 109 (1996).
7. X-ray power regulation and sample positioning repeatability are estimated to be constant to within 5%.
8. Nominal Pt thickness calculated from the Pt 4f peak areas assuming layer-by-layer growth and an inelastic mean free path of 16.8 Å.
9. L. J. Brillson, Surf. Sci. 299/300, 909 (1994).
10. P. M. Th. M van Attekum, and J. M. Trooster, J. Phys. F 9, 2287 (1979).