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Volumn 59, Issue 1, 2012, Pages 87-93

Temperature compensation of silicon resonators via degenerate doping

Author keywords

Aluminum thermomigration; degenerate boron doping; silicon micromechanical resonators; temperature compensation

Indexed keywords

BORON-DOPING; DEGENERATE BORON DOPING; MICROMECHANICAL RESONATOR; PROCESSING TIME; SILICON BULK ACOUSTIC RESONATORS; SILICON RESISTIVITY; SILICON RESONATORS; TEMPERATURE COEFFICIENT OF FREQUENCIES; TEMPERATURE COMPENSATION; THERMOMIGRATION;

EID: 84855433056     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2011.2172613     Document Type: Article
Times cited : (78)

References (31)
  • 1
    • 74049129897 scopus 로고    scopus 로고
    • MEMS for integrated timing and spectral processing
    • F. Ayazi, "MEMS for integrated timing and spectral processing," in Proc. IEEE CICC, 2009, pp. 65-72.
    • (2009) Proc. IEEE CICC , pp. 65-72
    • Ayazi, F.1
  • 3
    • 64549116238 scopus 로고    scopus 로고
    • A 145 MHz low phase-noise capacitive silicon micromechanical oscillator
    • H. M. Lavasani, A. K. Samarao, G. Casinovi, and F. Ayazi, "A 145 MHz low phase-noise capacitive silicon micromechanical oscillator," in IEDM Tech. Dig., 2008, pp. 675-678.
    • (2008) IEDM Tech. Dig. , pp. 675-678
    • Lavasani, H.M.1    Samarao, A.K.2    Casinovi, G.3    Ayazi, F.4
  • 4
    • 71449116454 scopus 로고    scopus 로고
    • Effect of phonon interactions on limiting the fQ Product of micromechanical resonators
    • R. Tabrizian, M. Rais-Zadeh, and F. Ayazi, "Effect of phonon interactions on limiting the fQ Product of micromechanical resonators," in Proc. Transducers, 2009, pp. 2131-2134.
    • (2009) Proc. Transducers , pp. 2131-2134
    • Tabrizian, R.1    Rais-Zadeh, M.2    Ayazi, F.3
  • 7
    • 76349115803 scopus 로고    scopus 로고
    • Real-time temperature compensation of MEMS oscillators using an integrated micro-oven and a phase-locked loop
    • Feb.
    • J. C. Salvia, R. Melamud, S. A. Chandorkar, S. F. Lord, and T. W. Kenny, "Real-time temperature compensation of MEMS oscillators using an integrated micro-oven and a phase-locked loop," J. Microelectromech. Syst., vol. 19, no. 1, pp. 192-201, Feb. 2010.
    • (2010) J. Microelectromech. Syst. , vol.19 , Issue.1 , pp. 192-201
    • Salvia, J.C.1    Melamud, R.2    Chandorkar, S.A.3    Lord, S.F.4    Kenny, T.W.5
  • 8
    • 34249780865 scopus 로고    scopus 로고
    • Electronically temperature compensated silicon bulk acoustic resonator reference oscillators
    • DOI 10.1109/JSSC.2007.896521
    • K. Sundaresan, G. K. Ho, S. Pourkamali, and F. Ayazi, "Electronically temperature compensated silicon bulk acoustic resonator reference oscillators," IEEE J. Solid-State Circuits, vol. 42, no. 6, pp. 1425-1434, Jun. 2007. (Pubitemid 46853250)
    • (2007) IEEE Journal of Solid-State Circuits , vol.42 , Issue.6 , pp. 1425-1434
    • Sundaresan, K.1    Ho, G.K.2    Pourkamali, S.3    Ayaji, F.4
  • 11
    • 36749107519 scopus 로고
    • Low-temperature coefficient bulk acoustic wave composite resonators
    • Feb.
    • J. S. Wang and K. M. Lakin, "Low-temperature coefficient bulk acoustic wave composite resonators," Appl. Phys. Lett., vol. 40, no. 4, pp. 308-310, Feb. 1982.
    • (1982) Appl. Phys. Lett. , vol.40 , Issue.4 , pp. 308-310
    • Wang, J.S.1    Lakin, K.M.2
  • 14
    • 61849164546 scopus 로고    scopus 로고
    • Thin-film piezoelectric-on-silicon resonators for high-frequency reference oscillator applications
    • Dec.
    • R. Abdolvand, H. M. Lavasani, G. Ho, and F. Ayazi, "Thin-film piezoelectric-on-silicon resonators for high-frequency reference oscillator applications," IEEE Trans. Ultrason., Ferroelectr., Freq. Control, vol. 55, no. 12, pp. 2596-2606, Dec. 2008.
    • (2008) IEEE Trans. Ultrason., Ferroelectr., Freq. Control , vol.55 , Issue.12 , pp. 2596-2606
    • Abdolvand, R.1    Lavasani, H.M.2    Ho, G.3    Ayazi, F.4
  • 16
    • 34547864173 scopus 로고    scopus 로고
    • Low-impedance VHF and UHF capacitive silicon bulk acoustic wave resonators - Part I: Concept and fabrication
    • DOI 10.1109/TED.2007.901403
    • S. Pourkamali, G. K. Ho, and F. Ayazi, "Low-Impedance VHF and UHF capacitive silicon bulk acoustic wave resonators - Part I: Concept and fabrication," IEEE Trans. Electron Devices, vol. 54, no. 8, pp. 2017-2023, Aug. 2007. (Pubitemid 47249833)
    • (2007) IEEE Transactions on Electron Devices , vol.54 , Issue.8 , pp. 2017-2023
    • Pourkamali, S.1    Ho, G.K.2    Ayazi, F.3
  • 17
    • 0005684137 scopus 로고
    • Effect of doping on elastic constants of silicon
    • Dec.
    • P. Csavinszky and N. G. Einspruch, "Effect of doping on elastic constants of silicon," Phys. Rev. Lett., vol. 132, no. 6, pp. 2434-2440, Dec. 1963.
    • (1963) Phys. Rev. Lett. , vol.132 , Issue.6 , pp. 2434-2440
    • Csavinszky, P.1    Einspruch, N.G.2
  • 18
    • 24244432832 scopus 로고
    • Ultrasonic attenuation and velocity changes in doped n-type germanium and p-type silicon and their use in determining an intrinsic electron and hole scattering time
    • Mar.
    • W. P. Mason, "Ultrasonic attenuation and velocity changes in doped n-type germanium and p-type silicon and their use in determining an intrinsic electron and hole scattering time," Phys. Rev. Lett., vol. 10, no. 5, pp. 151-154, Mar. 1963.
    • (1963) Phys. Rev. Lett. , vol.10 , Issue.5 , pp. 151-154
    • Mason, W.P.1
  • 19
    • 77952337062 scopus 로고    scopus 로고
    • Temperature compensation of silicon mi-cromechanical resonators via degenerate doping
    • A. K. Samarao and F. Ayazi, "Temperature compensation of silicon mi-cromechanical resonators via degenerate doping," in IEDM Tech. Dig., 2009, pp. 789-792.
    • (2009) IEDM Tech. Dig. , pp. 789-792
    • Samarao, A.K.1    Ayazi, F.2
  • 20
    • 36849136187 scopus 로고
    • Effect of holes on the elastic constant C' of degenerate p-type Si
    • Dec.
    • P. Csavinszky, "Effect of holes on the elastic constant C' of degenerate p-type Si," J. Appl. Phys., vol. 36, no. 12, pp. 3723-3727, Dec. 1965.
    • (1965) J. Appl. Phys. , vol.36 , Issue.12 , pp. 3723-3727
    • Csavinszky, P.1
  • 22
    • 20744449331 scopus 로고    scopus 로고
    • Analysis of highly doping with boron from spin-on diffusing source
    • DOI 10.1016/j.surfcoat.2004.10.093, PII S0257897204010989
    • C Iliescu, M. Carp, J. Miao, F. E. H. Tay, and D. P. Poenar, "Analysis of highly doping with boron from spin-on diffusing source," Surf. Coat. Technol., vol. 198, no. 1-3, pp. 309-313, Aug. 2005. (Pubitemid 40854701)
    • (2005) Surface and Coatings Technology , vol.198 , Issue.1-3 SPEC. ISS. , pp. 309-313
    • Iliescu, C.1    Carp, M.2    Miao, J.3    Tay, F.E.H.4    Poenar, D.P.5
  • 24
    • 0020879465 scopus 로고
    • Low temperature coefficient shear wave thin films for composite resonators and filters
    • J. S. Wang, A. R. Landin, and K. M. Lakin, "Low temperature coefficient shear wave thin films for composite resonators and filters," in Proc. Ultrasonics Symp., 1983, vol. 1, pp. 491-494. (Pubitemid 14535797)
    • (1983) Ultrasonics Symposium Proceedings , vol.1 , pp. 491-494
    • Wang, J.S.1    Landin, A.R.2    Lakin, M.M.3
  • 25
    • 80055037881 scopus 로고    scopus 로고
    • Sub-100 ppm/°C temperature stability in thermally actuated high frequency silicon resonators via degenerate phosphorous doping and bias current optimization
    • A. Hajjam, A. Rahafrooz, and S. Pourkamali, "Sub-100 ppm/°C temperature stability in thermally actuated high frequency silicon resonators via degenerate phosphorous doping and bias current optimization," in IEDM Tech. Dig., 2010, pp. 170-173.
    • (2010) IEDM Tech. Dig. , pp. 170-173
    • Hajjam, A.1    Rahafrooz, A.2    Pourkamali, S.3
  • 26
    • 0036573161 scopus 로고    scopus 로고
    • Determination of aluminum diffusion parameters in silicon
    • May
    • O. Krause, H. Ryssel, and P. Pichler, "Determination of aluminum diffusion parameters in silicon," J. Appl. Phys., vol. 91, no. 9, pp. 5645-5649, May 2002.
    • (2002) J. Appl. Phys. , vol.91 , Issue.9 , pp. 5645-5649
    • Krause, O.1    Ryssel, H.2    Pichler, P.3
  • 27
    • 0001739179 scopus 로고    scopus 로고
    • Mechanism of boron diffusion in silicon: An ab initio and kinetic monte carlo study
    • B. Sadigh, T. J. Lenosky, S. K. Theiss, M.-J. Caturla, T. Diaz de La Rubia, and M. A. Foad, "Mechanism of boron diffusion in silicon: An ab initio and kinetic Monte Carlo study," Phys. Rev. Lett., vol. 83, no. 21, pp. 4341-4344, Nov. 1999. (Pubitemid 129583091)
    • (1999) Physical Review Letters , vol.83 , Issue.21 , pp. 4341-4344
    • Sadigh, B.1    Lenosky, T.J.2    Theiss, S.K.3    Caturla, M.-J.4    De La Rubia, T.D.5    Foad, M.A.6
  • 28
    • 0004232799 scopus 로고
    • Huntington, NY: Krieger
    • W. Pfann, Zone Melting. Huntington, NY: Krieger, 1978.
    • (1978) Zone Melting
    • Pfann, W.1
  • 29
    • 0022360959 scopus 로고
    • Observations of the temperature gradient zone melting process for isolating small devices
    • D. Lischner, H. Basseches, and F. D'Altroy, "Observations of the temperature gradient zone melting process for isolating small devices," J. Electrochem. Soc., vol. 132, no. 12, pp. 2997-3001, Dec. 1985. (Pubitemid 15603117)
    • (1985) Journal of the Electrochemical Society , vol.132 , Issue.12 , pp. 2997-3001
    • Lischner, D.J.1    Basseches, H.2    D'Altroy, F.A.3
  • 30
    • 33749986328 scopus 로고    scopus 로고
    • Thermomigration-based junction isolation of bulk silicon MEMS devices
    • DOI 10.1109/JMEMS.2005.879685
    • C. C. Chung and M. G. Allen, "Thermomigration-based junction isolation of bulk silicon MEMS devices," J. Microelectromech. Syst., vol. 15, no. 5, pp. 1131-1138, Oct. 2006. (Pubitemid 44566930)
    • (2006) Journal of Microelectromechanical Systems , vol.15 , Issue.5 , pp. 1131-1138
    • Chung, C.C.1    Allen, M.G.2
  • 31
    • 65949086820 scopus 로고    scopus 로고
    • Post-fabrication electrical trimming of silicon bulk acoustic resonators using joule heating
    • A. K. Samarao and F. Ayazi, "Post-fabrication electrical trimming of silicon bulk acoustic resonators using joule heating," in Proc. IEEE Int. Conf. MEMS, 2009, pp. 892-895.
    • (2009) Proc. IEEE Int. Conf. MEMS , pp. 892-895
    • Samarao, A.K.1    Ayazi, F.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.