Guided assembly of nanoparticles on electrostatically charged nanocrystalline diamond thin films

Nanoscale Research Letters

Volumn 6, Issue 1, 2011, Pages

  Verveniotis, Elisseos ^a   Kromka, Alexander ^a   Ledinský, Martin ^a   Čermák, Jan ^a   Rezek, Bohuslav ^a  

^a INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ALUMINUM OXIDE; ATOMIC FORCE MICROSCOPY; DIAMONDS; ELECTROSTATICS; NANOCRYSTALLINE SILICON; NANOCRYSTALS; NANOPARTICLES; NANOSYSTEMS; SELF ASSEMBLY; SEMICONDUCTING SILICON COMPOUNDS; THIN FILMS;

ELECTROSTATIC POTENTIALS; ELECTROSTATICALLY CHARGED; ELECTROSTATICALLY DRIVEN; KELVIN FORCE MICROSCOPY; LOCAL ELECTROSTATIC CHARGING; NANOCRYSTALLINE DIAMOND (NCD) THIN FILMS; NANOCRYSTALLINE DIAMOND THIN FILMS; POLARIZATION FORCES; ATOMIC FORCE MICROSCOPES; COLLOIDAL ALUMINA; ELECTROSTATIC CHARGING; MATERIAL UNIFORMITY; MICROPATTERNS; NANO-DEVICES; NANOCRYSTALLINE DIAMONDS; NCD FILMS; PHASE CONTENT; SPATIAL UNIFORMITY; SUB-100 NM;

THIN FILMS; VANADIUM;

EID: 84255191007     PISSN: 19317573     EISSN: 1556276X     Source Type: Journal    
DOI: 10.1186/1556-276X-6-144     Document Type: Article

References (29)

1. Fudouzi H, Kobayashi M, Shinya N: "Site-controlled deposition of microsized particles using an electrostatic assembly". Adv Mater 2002, 14:1649.
2. Wright W, Chetwynd D: "Can charge writing aid nanotechnological manipulation?". Nanotechnology 1998, 9:133.
3. Mesquida P, Stemmer A: "Attaching silica nanoparticles from suspension onto surface charge patterns generated by a conductive atomic force microscope tip". Adv Mater 2001, 13:1395.
4. Jacobs H, Stemmer A: "Measuring and modifying the electric surface potential distribution on a nanometre scale: a powerful tool in science and technology". Surf Interface Anal 1999, 27:361.
5. Rezek B, Mates T, Stuchlík J, Kočka J, Stemmer A: "Charge storage in undoped hydrogenated amorphous silicon by ambient atomic force microscopy". Appl Phys Lett 2003, 83:1764.
6. Naujoks N, Stemmer A: "Micro- and nanoxerography in liquids - controlling pattern definition". Microelectron Eng 2005, 78/79:331.
7. Rezek B, Shin D, Watanabe H, Nebel CE: "Intrinsic hydrogen-terminated diamond as ion-sensitive field effect transistor". Sens Actuators B 2007, 122:596.
8. Rezek B, Shin D, Uetsuka H, Nebel CE: "Microscopic diagnostics of DNA molecules on mono-crystalline diamond". Phys Status Solidi A 2007, 204:2888.
9. Kalbacova M, Kalbac M, Dunsch L, Kromka A, Vaněček M, Rezek B, Hempel U, Kmoch S: "The effect of SWCNT and nano-diamond films on human osteoblast cells". Phys Status Solidi B 2007, 244:4356.
10. Kromka A, Rezek B, Remeš Z, Michalka M, Ledinský M, Zemek J, Potměšil J, Vaněček M: "Formation of continuous nanocrystalline diamond layers on glass and silicon at low temperatures". Chem Vap Deposition 2008, 14:181.
11. Nebel CE: "Semiconductor materials: From gemstone to semiconductor". Nat Mater 2003, 2:431.
12. Koizumi S, Kamo M, Sato Y, Ozaki H, Inuzuka T: "Growth and characterization of phosphorous doped {111} homoepitaxial diamond thin films". Appl Phys Lett 1997, 71:1065.
13. Chakrapani V, Angus JC, Anderson AB, Wolter SD, Stoner BR, Sumanasekera GU: "Charge transfer equilibria between diamond and an aqueous oxygen electrochemical redox couple". Science 2007, 318:1424.
14. Nebel CE, Rezek B, Shin D, Watanabe H, Yamamoto T: "Electronic properties of H-terminated diamond in electrolyte solutions". J Appl Phys 2006,99:033711.
15. Bergonzo P, Tromson D, Mer C: "Radiation detection devices made from CVD diamond". Semicond Sci Technol 2003, 18:S105.
16. Koide Y, Liao M, Alvarez J: "Thermally stable solar-blind diamond UV photodetector". Diamond Relat Mater 2006, 15:1962.
17. Stallhofer M, Seifert M, Hauf MV, Abstreiter G, Stutzmann M, Garrido JA, Holleitner AW: "Photoconductance of a submicron oxidized line in surface conductive single crystalline diamond". Appl Phys Lett 2010, 97:111107.
18. Sumikawa Y, Banno T, Kobayashi K, Itoh Y, Umezawa H, Kawarada H: "Memory effect of diamond in-plane-gated field-effect transistors". Appl Phys Lett 2004, 85:139.
19. Čermák J, Kromka A, Rezek B: "Electrical characterization of locally charged oxidized nanocrystalline diamond films by Kelvin force microscopy". Phys Status Solidi A 2008, 205:2136.
20. Verveniotis E, Čermák J, Kromka A, Rezek B: "AFM induced electrostatic charging of nanocrystalline diamond on silicon". Phys Status Solidi B 2009, 246:2798.
21. Verveniotis E, Čermák J, Kromka A, Ledinský M, Remeš Z, Rezek B: "Local electrostatic charging differences of sub-100 nm nanocrystalline diamond films". Phys Status Solidi A 2010, 207:2040.
22. Rezek B, Michalíková L, Ukraintsev E, Kromka A, Kalbacova M: "Micro-pattern guided adhesion of osteoblasts on diamond surfaces". Sensors 2009, 9:3549.
23. Rezek B, Nebel CE: "Kelvin force microscopy on diamond surfaces and devices". Diamond Relat Mater 2005, 14:466.
24. Kozak H, Kromka A, Ledinsky M, Rezek B: "Enhancing nanocrystalline diamond surface conductivity by deposition temperature and chemical post-processing". Phys Status Solidi A 2009, 206:276.
25. Bartošík M, Škoda D, Tomanec O, Kalousek R, Jánský P, Zlámal J, Spousta J, Dub P, Šikola T: "Role of humidity in local anodic oxidation: A study of water condensation and electric field distribution". Phys Rev B 2009, 79:195406.
26. Singh R, Arora SK, Tyagi R, Agarwal SK, Kanjila D: "Temperature dependence of current-voltage characteristics of Au/n-GaAs epitaxial Schottky diode". Bull Mater Sci 2000, 23:471.
27. Rezek B, Stuchlík J, Fejfar A, Kočka J: "Microcrystalline silicon thin films studied by atomic force microscopy with electrical current detection". J Appl Phys 2002, 92:587.
28. Häfliger D, Plitzko J, Hillenbrand R: "Contrast and scattering efficiency of scattering-type near-field optical probes". Appl Phys Lett 2004, 85:4466.
29. Verveniotis E, Rezek B, Šípek E, Stuchlik J, Kočka J: "Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon". Thin Solid Films 2010, 518:5965.