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Physica Status Solidi (A) Applications and Materials Science

Volumn 205, Issue 9, 2008, Pages 2136-2140

Electrical characterization of locally charged oxidized nanocrystalline diamond films by Kelvin force microscopy

(3) Cermak J a Kromka, A a Rezek, B a

a INSTITUTE OF PHYSICS (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

AMBIENT CONDITIONS; ATOMIC FORCE MICROSCOPES; CHARGE TRAPPING MECHANISMS; CONTACT MODES; CONTACT POTENTIAL DIFFERENCES; ELECTRICAL CHARACTERIZATIONS; GOLD ELECTRODES; KELVIN FORCE MICROSCOPIES; NANOCRYSTALLINE DIAMOND FILMS; NANOCRYSTALLINE DIAMONDS; OXYGEN PLASMAS; POSITIVELY CHARGED; TRAPPED CHARGES;

ATOMIC FORCE MICROSCOPY; CHARGE TRAPPING; DIAMOND CUTTING TOOLS; DIAMONDS; MICROSCOPIC EXAMINATION; NANOCRYSTALLINE ALLOYS; NANOCRYSTALLINE MATERIALS; NANOSTRUCTURED MATERIALS; OXYGEN; THICK FILMS; THICKNESS MEASUREMENT; THIN FILMS;

DIAMOND FILMS;

EID: 54249150999 PISSN: 18626300 EISSN: 18626319 Source Type: Journal
DOI: 10.1002/pssa.200879712 Document Type: Conference Paper

Times cited : (12)

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