Attaching silica nanoparticles from suspension onto surface charge patterns generated by a conductive atomic force microscope tip

Advanced Materials

Volumn 13, Issue 18, 2001, Pages 1395-1398

  Cao, H Q ^a   Xu, Y ^a   Hong, J M ^a   Liu, H B ^a   Yin, G ^a   Li, B L ^a   Tie, C Y ^a   Xu, Z ^a,b  

^a NANJING UNIVERSITY   (China)

^b NANJING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FLUOROCARBONS; PERMITTIVITY; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; POLYTETRAFLUOROETHYLENES; SCANNING ELECTRON MICROSCOPY; SILICA; STRUCTURE (COMPOSITION); SUSPENSIONS (FLUIDS);

KELVIN PROBE FORCE FORCE MICROSCOPY; SURFACE CHARGE PATTERN; SURFACE POTENTIAL;

NANOSTRUCTURED MATERIALS;

EID: 0035860304     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-4095(200109)13:18<1395::AID-ADMA1395>3.0.CO;2-0     Document Type: Article

References (16)