Measuring and modifying the electric surface potential distribution on a nanometre scale: a powerful tool in science and technology

Surface and Interface Analysis

Volumn 27, Issue 5, 1999, Pages 361-367

  Jacobs, H O ^a   Stemmer, A ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; ELECTRIC FIELDS; HETEROJUNCTIONS; HIGH ELECTRON MOBILITY TRANSISTORS; METALLIC FILMS; OPTICAL RESOLVING POWER; PROBES; SEMICONDUCTOR MATERIALS; THREE DIMENSIONAL; VOLTAGE MEASUREMENT;

ELECTRIC SURFACE POTENTIAL DISTRIBUTION; KELVIN PROBE FORCE MICROSCOPY; KELVIN PROBE TECHNOLOGY;

SURFACE PROPERTIES;

EID: 0032682055     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199905/06)27:5/6<361::AID-SIA482<3.0.CO;2-8     Document Type: Article

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