Enhancing nanocrystalline diamond surface conductivity by deposition temperature and chemical post-processing

Physica Status Solidi (A) Applications and Materials Science

Volumn 206, Issue 2, 2009, Pages 276-280

  Kozak, H ^a   Kromka, A ^a   Ledinsky, M ^a   Rezek, B ^a  

^a INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

AS-GROWN; ATOMIC-FORCE MICROSCOPIES; AU ELECTRODES; CURRENT-VOLTAGE MEASUREMENTS; DEPOSITION TEMPERATURES; HYDROGENATION TEMPERATURES; NANOCRYSTALLINE DIAMOND FILMS; NANOCRYSTALLINE DIAMONDS; NCD FILMS; PHASE DETECTIONS; POST-PROCESSING; SURFACE CONDUCTIVITIES; SURFACE MATERIALS; THREE ORDERS OF MAGNITUDES;

DIAMOND FILMS; DIAMONDS; DIELECTRIC PROPERTIES; ELECTRIC CONDUCTIVITY; GOLD; HYDROGENATION; NANOCRYSTALLINE MATERIALS; SURFACE MORPHOLOGY;

SURFACE PROPERTIES;

EID: 62549105747     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200824355     Document Type: Conference Paper

References (20)

1. L. Bacakova, L. Grausova, J. Vacik, A. Fraczek, S. Blazewicz, A. Kromka, M. Vanecek, and V. Svorcik, Diam. Relat. Mater. 16, 2133 (2007).
2. C. E. Nebel, H. Kato, B. Rezek, D. Shin, D. Takeuchi, H. Watanabe, and T. Yamamoto, Diam. Relat. Mater. 15, 264 (2006).
3. B. Rezek, H. Watanabe, D. Shin, T. Yamamoto, and C. E. Nebel, Diam. Relat. Mater. 15, 673 (2006).
4. S. Koizumi, K. Watanabe, M. Hasegawa, and H. Kanda, Science 292, 1899 (2001).
5. R. Muller, A. Denisenko, M. Adamschik, and E. Kohn, Diam. Relat. Mater. 11, 651 (2002).
6. M. I. Landstrass and K. V. Ravi, Appl. Phys. Lett. 55, 975 (1989).
7. L. Ley, J. Ristein, F. Meier, M. Riedel, and P. Strobel, Physica B 376/377, 262 (2006).
8. J. B. Cui, J. Ristein, and L. Ley, Phys. Rev. Lett. 81, 429 (1998).
9. W. Deferme, G. Tanasa, J. Amir, K. Haenen, M. Nesladek, and C. F. J. Flipse, Diam. Relat. Mater. 15, 687 (2006).
10. B. Rezek, D. Shin, H. Watanabe, and C E. Nebel, Sens. Actuators B 122, 596 (2007).
11. B. Rezek and C E. Nebel, Diam. Relat. Mater. 15, 1374 (2006).
12. S. Potocky, A. Kromka, J. Potmesil, Z. Remes, V. Vorlicek, M. Vanecek, and M. Michalka, Diam. Relat. Mater. 16, 744 (2007).
13. A. Kromka, Š. Potocký, J. Čermák, B. Rezek, J. Potměšil, J. Zemek, and M. Vaněček, Diam. Relat. Mater. 17, 1252 (2008).
14. A. Kromka, B. Rezek, Z. Remes, M. Michalka, M. Ledinsky, J. Zemek, J. Potmesil, and M. Vanecek, Chem. Vapor. Depos. 14, 181 (2008).
15. R. Swanepoel, J. Phys., E, Sci. Instrum. 17, 896 (1984).
16. J. Zemek, J. Houdkova, B. Lesiak, A. Jablonski, J. Potmesil, and M. Vanecek, J. Optoelectron. Adv. Mater. 8, 2133 (2006).
17. B. Rezek, D. Shin, H. Uetsuka, and C E. Nebel, Phys. Status Solidi A 204, 2888 (2007).
18. R. Garcia, C. J. Gomez, N. F. Martinez, S. Patil, C Dietz, and R. Magerle, Phys. Rev. Lett. 97, 016103 (2006).
19. F. Maier, M. Riedel, B. Mantel, J. Ristein, and L. Ley, Phys. Rev. Lett. 85, 3472 (2000).
20. P. M. Koinkar, P. P. Patil, M. A. More, V. N. Tondare, and D. S. Joag, Vacuum 72, 321 (2004).