메뉴 건너뛰기




Volumn 14, Issue 1, 2012, Pages 205-217

XANES and XPS investigations of the local structure and final-state effects in amorphous metal silicates: (ZrO2)x(TiO 2)y(SiO2)1-x-y

Author keywords

[No Author keywords available]

Indexed keywords


EID: 82955164334     PISSN: 14639076     EISSN: None     Source Type: Journal    
DOI: 10.1039/c1cp22717c     Document Type: Article
Times cited : (22)

References (101)
  • 37
    • 29744434208 scopus 로고    scopus 로고
    • ed. A. A. Demkov and A. Navrotsky, Springer, Dordrecht, Netherlands
    • G.-M. Rignanese, in Materials Fundamentals of Gate Dielectrics, ed., A. A. Demkov, and, A. Navrotsky, Springer, Dordrecht, Netherlands, 2005, pp. 249-290
    • (2005) Materials Fundamentals of Gate Dielectrics , pp. 249-290
    • Rignanese, G.-M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.