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Volumn 86, Issue 5-6, 2001, Pages 681-689
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Rare-earth elements in synthetic zircon: Part 2. A single-crystal X-ray study of xenotime subsititution
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Author keywords
[No Author keywords available]
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Indexed keywords
BINARY ALLOYS;
LITHIUM ALLOYS;
LITHIUM COMPOUNDS;
LITHIUM METALLOGRAPHY;
MOLYBDENUM ALLOYS;
MOLYBDENUM METALLOGRAPHY;
MOLYBDENUM OXIDE;
RARE EARTH ELEMENTS;
RARE EARTHS;
SILICATE MINERALS;
SINGLE CRYSTALS;
ZIRCON;
ZIRCONIUM;
COMPENSATING ELEMENT;
INTERSTITIAL SITES;
PARTITION COEFFICIENT;
SINGLE CRYSTAL X-RAY DIFFRACTION;
STRUCTURAL STRAIN;
SYNTHETIC ZIRCON CRYSTALS;
TRIVALENT LANTHANIDES;
ZIRCON STRUCTURE;
SILICON;
CRYSTAL STRUCTURE;
PHOSPHORUS;
RARE EARTH ELEMENT;
SUBSTITUTION;
XENOTIME;
ZIRCON;
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EID: 0035013720
PISSN: 0003004X
EISSN: None
Source Type: Journal
DOI: 10.2138/am-2001-5-608 Document Type: Article |
Times cited : (130)
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References (47)
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