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Volumn 21, Issue 6, 2011, Pages 1829-1836
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XANES and XPS investigations of (TiO2)x(SiO 2)1-x: The contribution of final-state relaxation to shifts in absorption and binding energies
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Author keywords
[No Author keywords available]
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Indexed keywords
ABSORPTION ENERGIES;
AMORPHOUS POWDERS;
ANNEALED SAMPLES;
CHEMICAL FORMULAE;
EDGE SPECTRA;
IONIC RADIUS;
NEAREST-NEIGHBOUR;
O K-EDGES;
SOL-GEL METHODS;
SURFACE HYDROXIDE;
TI ATOMS;
TI CONTENT;
TIO;
X-RAY ABSORPTION NEAR EDGE SPECTROSCOPY;
XANES;
XPS;
ABSORPTION;
ABSORPTION SPECTROSCOPY;
ATOMIC SPECTROSCOPY;
BINDING ENERGY;
SILICON COMPOUNDS;
SOL-GEL PROCESS;
SURFACES;
X RAY PHOTOELECTRON SPECTROSCOPY;
X RAYS;
AMORPHOUS MATERIALS;
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EID: 79251470403
PISSN: 09599428
EISSN: 13645501
Source Type: Journal
DOI: 10.1039/c0jm03464a Document Type: Article |
Times cited : (44)
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References (68)
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