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Volumn 104, Issue 36, 2000, Pages 8670-8678

Quantitative analysis of Ti-O-Si and Ti-O-Ti bonds in Ti-Si binary oxides by the linear combination of XANES

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; COMPOSITION EFFECTS; MONOLAYERS; SILICA; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0034276182     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp000042+     Document Type: Article
Times cited : (74)

References (41)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.