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Volumn 178-179, Issue C, 2010, Pages 123-127

Auger parameters and Wagner plots

Author keywords

Auger parameter; Effect of the local chemical environment of core ionized atom; Molden; Tinker; X ray excited Auger transitions; XPS

Indexed keywords

AUGER PARAMETERS; AUGER TRANSITIONS; CHEMICAL ENVIRONMENT; IONIZED ATOM; XPS;

EID: 77951024325     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2009.07.008     Document Type: Article
Times cited : (23)

References (21)
  • 5
    • 77951022164 scopus 로고    scopus 로고
    • NIST XPS Database: version 4.0 http://www.nist.gov/srd/surface.htm (free online system NIST XPS Database: version 3.5).
    • NIST XPS Database: version 4.0 http://www.nist.gov/srd/surface.htm (free online system NIST XPS Database: version 3.5).
  • 16
    • 42449152376 scopus 로고
    • Hahn T. (Ed), Reidel, Dordrecht, Holland
    • In: Hahn T. (Ed). International Tables for X-ray Crystallography vol. A (1983), Reidel, Dordrecht, Holland 288
    • (1983) International Tables for X-ray Crystallography , vol.A , pp. 288


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.