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Physical Review B - Condensed Matter and Materials Physics

Volumn 63, Issue 12, 2001, Pages 1251171-1251177

Bonding and XPS chemical shifts in ZrSiO4 versus SiO2 and ZrO2: Charge transfer and electrostatic effects

(3) Guittet, M J a Crocombette, J P a Gautier Soyer, M a

a CEA SACLAY (France)

Author keywords

[No Author keywords available]

Indexed keywords

SILICONE DERIVATIVE; ZIRCONIUM DERIVATIVE;

ARTICLE; CHEMICAL BOND; COVALENT BOND; CRYSTAL STRUCTURE; ELECTRICITY; MATHEMATICAL ANALYSIS; PHENOMENOLOGY; QUANTUM MECHANICS; VALIDATION PROCESS; X RAY SPECTROMETRY;

EID: 0034909708 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (343)

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