Analysis of x-ray reflectivity data from low-contrast polymer bilayer systems using a Fourier method

Applied Physics Letters

Volumn 76, Issue 19, 2000, Pages 2713-2715

  Seeck, O H ^a,e   Kaendler, I D ^a   Tolan, M ^b   Shin, K ^c   Rafailovich, M H ^c   Sokolov, J ^c   Kolb, R ^d  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF KIEL   (Germany)

^c STONY BROOK UNIVERSITY   (United States)

^d EXXONMOBIL UPSTREAM RESEARCH COMPANY   (United States)

^e DESY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001540733     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.126452     Document Type: Article

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