SCOPUS 정보 검색 플랫폼

Ultramicroscopy

Volumn 108, Issue 10, 2008, Pages 1315-1318

Surface morphology and interdiffusion of LiF in Alq3-based organic light-emitting devices

(7) Lee, Young Joo a Li, Xiaolong a Kang, Da Yeon a Park, Seong Sik b Kim, Jinwoo c Choi, Jeong Woo a Kim, Hyunjung a

a Sogang University (South Korea)

b Samsung Corning Co Ltd (South Korea)

c Gwangju Institute of Science and Technology (GIST) (South Korea)

Author keywords

Atomic force microscopy; Interdiffusion; LiF; Organic light emitting device; surface morphology; X ray reflectivity

Indexed keywords

ALUMINA; LIGHT METALS; LITHIUM;

ATOMIC FORCE MICROSCOPY; ELECTRON-TRANSPORT LAYER; HIGHLY EFFICIENT; INTERDIFFUSION; LIF; LITHIUM FLUORIDE; ORGANIC LIGHT-EMITTING DEVICE; ORGANIC LIGHT-EMITTING DEVICES; SURFACE MORPHOLOGY; TRIS-ALUMINUM; X-RAY REFLECTIVITY;

ALUMINUM;

ALUMINUM; LITHIUM FLUORIDE;

ARTICLE; ATOMIC FORCE MICROSCOPY; DIFFUSION COEFFICIENT; ELECTRON TRANSPORT; INFRARED RADIATION; MEDICAL INSTRUMENTATION; MORPHOLOGY; RADIATION SCATTERING; ROOM TEMPERATURE; SYNCHROTRON RADIATION;

EID: 49949108160 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/j.ultramic.2008.04.086 Document Type: Article

Times cited : (9)

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