Interfacial structure in semiconducting polymer devices

Journal of Materials Chemistry

Volumn 13, Issue 11, 2003, Pages 2814-2818

  Higgins, Anthony M ^a   Martin, Simon J ^a   Jukes, Paul C ^a   Geoghegan, Mark ^a   Jones, Richard A L ^a   Langridge, Sean ^b   Cubitt, Robert ^c   Kirchmeyer, Stephan ^d   Wehrum, Anja ^e   Grizzi, Ilaria ^e  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

^b RUTHERFORD APPLETON LABORATORY   (United Kingdom)

^c INSTITUT LAUE LANGEVIN   (France)

^d HC Starck GmbH   (Germany)

^e Cambridge Display Technology Ltd   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; ELECTRIC CONDUCTORS; INSULATING MATERIALS; INTERFACES (MATERIALS); NEUTRON REFLECTION; SEMICONDUCTING POLYMERS; SEMICONDUCTOR DOPING;

INSULATING POLYMERS; INTERFACIAL STRUCTURES; SCANNING FORCE MICROSCOPY;

SEMICONDUCTOR DEVICES;

POLYMER;

CHEMICAL STRUCTURE; CONFERENCE PAPER; DEVICE; MOLECULAR PHYSICS; NEUTRON; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR; STRUCTURE ANALYSIS;

EID: 0242407169     PISSN: 09599428     EISSN: None     Source Type: Journal    
DOI: 10.1039/b304990f     Document Type: Conference Paper

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