Study of thermal degradation of organic light emitting device structures by X-ray scattering

Thin Solid Films

Volumn 515, Issue 14 SPEC. ISS., 2007, Pages 5674-5677

  Lee, Young Joo ^a   Lee, Heeju ^a   Byun, Youngsuk ^a   Song, Sanghoon ^a   Kim, Je Eun ^a   Eom, Daeyong ^a   Cha, Wonsuk ^a   Park, Seong Sik ^b   Kim, Jinwoo ^c   Kim, Hyunjung ^a  

^a Sogang University   (South Korea)

^b Orion OLED Co Ltd   (South Korea)

^c Gwangju Institute of Science and Technology (GIST)   (South Korea)

Author keywords

Intermixing; Organic light emitting device; Thermal degradation; X ray reflectivity

Indexed keywords

CRYSTALLIZATION; MULTILAYERS; PYROLYSIS; SYNCHROTRONS; THERMAL EXPANSION; X RAY SCATTERING;

INTERMIXING; SYNCHROTRON X RAY SCATTERING; X RAY REFLECTIVITY;

ORGANIC LIGHT EMITTING DIODES (OLED);

EID: 34247121894     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.12.018     Document Type: Article

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