Electrical mobility in organic thin-film transistors determined by noise spectroscopy

Journal of Applied Physics

Volumn 110, Issue 9, 2011, Pages

  Bonavolonta C ^a,b   Albonetti, C ^c   Barra, M ^a,b   Valentino, M ^a,b  

^a CNR SPIN   (Italy)

^b UNIVERSITY OF NAPLES FEDERICO II   (Italy)

^c CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE MOBILITIES; ELECTRICAL MOBILITY; FUNCTIONALIZED; GATE VOLTAGES; I-V MEASUREMENTS; LOW-FREQUENCY NOISE; NOISE FLUCTUATIONS; NOISE SPECTROSCOPY; OCTANETHIOL; ORGANIC THIN FILM TRANSISTORS; ORGANIC THIN FILMS; P-TYPE; PENTACENES; PERYLENE DERIVATIVES; SEXITHIOPHENES; TRANSPORT MECHANISM;

ORGANIC FIELD EFFECT TRANSISTORS; POWER SPECTRAL DENSITY; SEMICONDUCTING ORGANIC COMPOUNDS; SPECTRAL DENSITY; THERMAL NOISE; THIN FILM TRANSISTORS;

CARRIER MOBILITY;

EID: 81355163331     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3658846     Document Type: Article

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