Scaling behavior of anisotropic organic thin films grown in high vacuum

Physical Review Letters

Volumn 78, Issue 12, 1997, Pages 2389-2392

  Biscarini, F ^a   Samori P ^a   Greco, O ^a   Zamboni, R ^a  

^a CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; COMPOSITION EFFECTS; COMPUTER SIMULATION; FILM GROWTH; INTERFACES (MATERIALS); MICROSCOPIC EXAMINATION; MOLECULAR PHYSICS; SUBLIMATION; SURFACE ROUGHNESS; THERMAL EFFECTS; VACUUM APPLICATIONS;

CORRELATION LENGTH; HIGH VACUUM SUBLIMATION; LAMELLAE; ORGANIC THIN FILMS; POWER SPECTRAL DENSITY; SCALING; SCANNING FORCE MICROSCOPY; SURFACE FLUCTUATIONS;

THIN FILMS;

EID: 0031096885     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.78.2389     Document Type: Article

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