메뉴 건너뛰기




Volumn 95, Issue 23, 2009, Pages

Trapping-detrapping fluctuations in organic space-charge layers

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT FLUCTUATIONS; CURRENT NOISE; DE-TRAPPING; DEEP TRAPS; ENERGY LEVEL; INJECTION CONDITIONS; ORGANIC SEMICONDUCTOR; POLYACENES; SPACE CHARGES; TRAP-FILLING TRANSITION; TRAPPING-DETRAPPING MODEL;

EID: 71949086756     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3271769     Document Type: Article
Times cited : (52)

References (30)
  • 1
    • 33746629488 scopus 로고    scopus 로고
    • A bright future for organic field-effect transistors
    • DOI 10.1038/nmat1699, PII NMAT1699
    • M. Muccini, Nature Mater. 1476-1122 5, 605 (2006). 10.1038/nmat1699 (Pubitemid 44157676)
    • (2006) Nature Materials , vol.5 , Issue.8 , pp. 605-613
    • Muccini, M.1
  • 2
    • 37149038557 scopus 로고    scopus 로고
    • Trap-controlled hole transport in small molecule organic semiconductors
    • DOI 10.1063/1.2820448
    • A. Fleissner, H. Schmid, C. Melzer, and H. Seggern, Appl. Phys. Lett. 0003-6951 91, 242103 (2007). 10.1063/1.2820448 (Pubitemid 350262004)
    • (2007) Applied Physics Letters , vol.91 , Issue.24 , pp. 242103
    • Fleissner, A.1    Schmid, H.2    Melzer, C.3    Von Seggern, H.4
  • 6
    • 15844420900 scopus 로고    scopus 로고
    • Energy level alignment at interfaces with pentacene: Metals versus conducting polymers
    • DOI 10.1016/j.apsusc.2004.10.128, PII S0169433204017805, 12th International Conference on Solid Films and Surfaces
    • N. Koch, A. Elschner, R. L. Johnson, and J. P. Rabe, Appl. Surf. Sci. 0169-4332 244, 593 (2005). 10.1016/j.apsusc.2004.10.128 (Pubitemid 40423777)
    • (2005) Applied Surface Science , vol.244 , Issue.1-4 , pp. 593-597
    • Koch, N.1    Elschner, A.2    Johnson, R.L.3    Rabe, J.P.4
  • 13
    • 34247253381 scopus 로고    scopus 로고
    • Two-dimensional analytical Mott-Gurney law for a trap-filled solid
    • DOI 10.1063/1.2721382
    • W. Chandra, L. K. Ang, and K. L. Pey, Appl. Phys. Lett. 0003-6951 90, 153505 (2007). 10.1063/1.2721382 (Pubitemid 46609899)
    • (2007) Applied Physics Letters , vol.90 , Issue.15 , pp. 153505
    • Chandra, W.1    Ang, L.K.2    Pey, K.L.3    Ng, C.M.4
  • 16
    • 0017969151 scopus 로고
    • 10.1016/0378-4363(78)90137-7 0034-4885;, Re Prog. Phys. 0034-4885 44, 479 (1981). 10.1088/0034-4885/44/5/001
    • T. G. M. Kleinpenning, Physica B & C 94, 141 (1978) 10.1016/0378-4363(78)90137-7 0034-4885; F. N. Hooge, T. G. M. Kleinpenning, and L. K. J. Vandamme, Rep. Prog. Phys. 0034-4885 44, 479 (1981). 10.1088/0034-4885/44/5/001
    • (1978) Physica B & C , vol.94 , pp. 141
    • Kleinpenning, T.G.M.1    Hooge, F.N.2    Kleinpenning, T.G.M.3    Vandamme, L.K.J.4
  • 17
    • 0037636509 scopus 로고    scopus 로고
    • 0021-8979. 10.1063/1.1563291
    • C. M. Van Vliet, J. Appl. Phys. 0021-8979 93, 6068 (2003). 10.1063/1.1563291
    • (2003) J. Appl. Phys. , vol.93 , pp. 6068
    • Van Vliet, C.M.1
  • 19
    • 0001371316 scopus 로고    scopus 로고
    • 0163-1829. 10.1103/PhysRevB.58.3904
    • P. Verleg and J. I. Dijkhuis, Phys. Rev. B 0163-1829 58, 3904 (1998). 10.1103/PhysRevB.58.3904
    • (1998) Phys. Rev. B , vol.58 , pp. 3904
    • Verleg, P.1    Dijkhuis, J.I.2
  • 20
    • 84949116154 scopus 로고    scopus 로고
    • 0021-8979. 10.1063/1.362952;
    • A. Carbone and P. Mazzetti, J. Appl. Phys. 0021-8979 80, 1559 (1996) 10.1063/1.362952;
    • (1996) J. Appl. Phys. , vol.80 , pp. 1559
    • Carbone, A.1    Mazzetti, P.2
  • 21
    • 3142558445 scopus 로고
    • 0163-1829. 10.1103/PhysRevB.49.7592
    • A. Carbone and P. Mazzetti, Phys. Rev. B 0163-1829 49, 7592 (1994); 10.1103/PhysRevB.49.7592
    • (1994) Phys. Rev. B , vol.49 , pp. 7592
    • Carbone, A.1    Mazzetti, P.2
  • 22
    • 0039516153 scopus 로고
    • 0163-1829. 10.1103/PhysRevB.49.7603
    • A. Carbone and P. Mazzetti, Phys. Rev. B 0163-1829 49, 7603 (1994). 10.1103/PhysRevB.49.7603
    • (1994) Phys. Rev. B , vol.49 , pp. 7603
    • Carbone, A.1    Mazzetti, P.2
  • 30
    • 36849116678 scopus 로고
    • 0021-8979. 10.1063/1.1728487
    • P. Mark and W. Helfrich, J. Appl. Phys. 0021-8979 33, 205 (1962). 10.1063/1.1728487
    • (1962) J. Appl. Phys. , vol.33 , pp. 205
    • Mark, P.1    Helfrich, W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.