Low-frequency noise measurement and analysis in organic light-emitting diodes

IEEE Electron Device Letters

Volumn 27, Issue 7, 2006, Pages 555-557

  Ke, Lin ^a   Zhao, Xin Yue ^b   Kumar, Ramadas Senthil ^a   Chua, Soo Jin ^a,b  

^a INSTITUTE OF MATERIALS RESEARCH AND ENGINEERING   (Singapore)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

1 f noise; Low frequency noise; Organic light emitting diode (OLED)

Indexed keywords

CARRIER MOBILITY; DEGRADATION; ELECTROLUMINESCENCE; ELECTRON TRAPS; GAUSSIAN NOISE (ELECTRONIC); INTERFACES (MATERIALS); PHOTOOXIDATION; SPURIOUS SIGNAL NOISE;

CARRIER NUMBERS; LOW-FREQUENCY NOISE; ORGANIC LIGHT-EMITTING DIODES;

LIGHT EMITTING DIODES;

EID: 33745678548     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2006.877283     Document Type: Article

References (14)

1. D. D. C. Bradley, "Electroluminescent polymers: Materials, physics and device engineering," Curr. Opin. Solid State Mater. Sci., vol. 1, no. 6, pp. 789-798, Dec. 1996.
2. J. R. Sheats, H. Antoniadis, M. Hueschen, W. Leonard, J. Miller, R. Moon, D. Roitman, and A. Stocking, "Organic electroluminescent devices," Science, vol. 273, no. 5277, pp. 884-888, Aug. 1996.
3. S. M. Bezrukov and J. J. Kasianowicz, "Current noise reveals protonation kinetics and number of ionizable sites in an open protein ion channel," Phys. Rev. Lett., vol. 70, no. 15, pp. 2352-2355, Apr. 1993.
4. B. D. Ursutis and B. K. Jones, "Low-frequency noise used as a lifetime test of LEDs," Semicond. Sci. Technol., vol. 11, no. 8, pp. 1133-1136, Aug. 1996.
5. M. Fukuda, T. Hirono, and F. Kano, "Degradation behavior of narrow-spectral-linewidth DFB lasers," IEEE Photon. Technol. Lett., vol. 5, no. 218, pp. 1165-1167, 1993.
6. G. Letal, S. Smetona, R. Mallard, J. Matukas, and V. Palenskis, "Reliability and low-frequency noise measurements of InGaAsP multiple quantum well buried-heterostructure lasers," J. Vac. Sci. Technol. A, Vac. Surf. Films, vol. 20, no. 3, pp. 1061-1066, May 2002.
7. F. N. Hooge, T. G. M. Kleinpenning, and L. K. J. Vandamme, "Experimental studies on 1/f noise," Rep. Prog. Phys., vol. 44, no. 5, pp. 479-532, May 1981.
8. M. Kroutvar, "Detecting Si-defects with diodes," M.S. thesis, Dept. Phys., Univ. Missouri, St. Louis, Jul. 12, 1999.
9. B. H. Cumpston and K. F. Jensen, "Photo-oxidation of polymers used in electroluminescent devices," Synth. Met., vol. 73, no. 3, pp. 195-199, Aug. 1995.
10. Y. Kaminorz, E. Smela, O. Inganas, and L. Brehmer, "Sensitivity of polythiophene planar light-emitting diodes to oxygen," Adv. Mater., vol. 10, no. 10, pp. 765-769, 1998.
11. K. L. Wang, "Low noise microwave devices: GaAs/InAs pseudomorphic high electron mobility transistor (pHEMTs)," Electr. Eng. Dept., Univ. California, Los Angeles, CA, Final Rep. 1997-98 for MICRO Project 97-195.
12. Y. Song, A. Misra, P. P. Crooker, and J. R. Gaines, "1/f noise and morphology of YBa2Cu3O7-δ single crystals," Phys. Rev. Lett., vol. 66, no. 6, pp. 825-828, Feb. 1991.
13. S. L. Rumyantsev, Y. Deng, S. Shur, M. E. Levinshtein, M. Asif Khan, G. Simin, J. Yang, X. Hu, and R. Gaska, "On the low frequency noise mechanisms in GaN/AlGaN HFETs," Semicond. Sci. Technol., vol. 18, no. 6, pp. 589-593, Jun. 2003.
14. L. Ke, S. J. Chua, K. R. Zhang, and N. Yakolev, "Degradation and failure of organic light-emitting devices," Appl. Phys. Lett., vol. 80, no. 12, pp. 2195-2197, Mar. 2002.