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Volumn 92, Issue 13, 2008, Pages

Correlation between microstructure, electronic properties and flicker noise in organic thin film transistors

(9) Jurchescu, Oana D a,b Hamadani, Behrang H a Xiong, Hao D a Park, Sungkyu K b Subramanian, Sankar c Zimmerman, Neil M a Anthony, John E c Jackson, Thomas N b Gundlach, David J a

a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

b The Pennsylvania State University (United States)

c UNIVERSITY OF KENTUCKY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT ANGLE; CORRELATION THEORY; DRAIN CURRENT; ELECTRONIC PROPERTIES; FIELD EFFECT TRANSISTORS; GRAIN GROWTH; MICROSTRUCTURE; SEMICONDUCTING ORGANIC COMPOUNDS;

FLICKER NOISE; MICROSTRUCTURE CHANGES; ORGANIC THIN FILM TRANSISTORS; TRANSISTOR CHANNELS;

THIN FILM TRANSISTORS;

EID: 41649098463 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2903508 Document Type: Article

Times cited : (85)

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