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Volumn 87, Issue 7, 2000, Pages 3381-3385

Flicker noise properties of organic thin-film transistors

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001000956     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.372354     Document Type: Article
Times cited : (69)

References (23)
  • 3
    • 0032511040 scopus 로고    scopus 로고
    • A. Dodabalapur, Z. Bao, A. Makhija, J. G. Laquindanum, V. R. Raju, Y. Feng, H. E. Katz, and J. Rogers, Appl. Phys. Lett. 73, 142 (1998); H. Sirringhaus, N. Tessler, and R. H. Friend, Science 280, 1741 (1998).
    • (1998) Science , vol.280 , pp. 1741
    • Sirringhaus, H.1    Tessler, N.2    Friend, R.H.3
  • 18
    • 0003768306 scopus 로고
    • Wiley, New York
    • A. van der Ziel, Noise in Measurements (Wiley, New York, 1976); A. L. Mc Whorter, in Semiconductor Surface Physics, edited by R. H. Kingston (University of Pennsylvania Press, Philadelphia, PA, 1957).
    • (1976) Noise in Measurements
    • Van Der Ziel, A.1
  • 19
    • 0003788671 scopus 로고
    • edited by R. H. Kingston University of Pennsylvania Press, Philadelphia, PA
    • A. van der Ziel, Noise in Measurements (Wiley, New York, 1976); A. L. Mc Whorter, in Semiconductor Surface Physics, edited by R. H. Kingston (University of Pennsylvania Press, Philadelphia, PA, 1957).
    • (1957) Semiconductor Surface Physics
    • Mc Whorter, A.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.