Diagnosis of low-frequency noise sources in contact resistance of staggered organic transistors

Applied Physics Letters

Volumn 98, Issue 3, 2011, Pages

  Xu, Y ^a   Gwoziecki, R ^b   Coppard, R ^b   Benwadih, M ^b   Minari, T ^c,d   Tsukagoshi, K ^c,e   Chroboczek, J A ^a   Balestra, F ^a   Ghibaudo, G ^a  

^a IMEP LAHC   (France)

^b CEA GRENOBLE   (France)

^c NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^d RIKEN   (Japan)

^e JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BIS(TRIISOPROPYLSILYLETHYNYL) PENTACENE; CARRIER NUMBER FLUCTUATION; CHANNEL NOISE; CONTACT NOISE; DIAGNOSTIC PROCEDURE; HOOGE MOBILITY FLUCTUATIONS; HOOGE PARAMETERS; LOW-FREQUENCY NOISE SOURCES; ORGANIC TRANSISTOR; PENTACENE TRANSISTORS;

ACOUSTIC NOISE; DEFECT DENSITY; THERMAL NOISE; TRANSISTORS;

CARRIER MOBILITY;

EID: 79251541501     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3544583     Document Type: Article

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