The modern electron microscope: A cornucopia of chemico-physical insights

Chemical Physics

Volumn 385, Issue 1-3, 2011, Pages 1-10

  Thomas, John Meurig ^a   Midgley, Paul A ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

Dislocation; EELS; Electron microscopy; Electron tomography; Femtosecond imaging and diffraction; Graphene; Light atom imaging; Radiation damage; STEM; Structural dynamics

Indexed keywords

EID: 80955179544     PISSN: 03010104     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.chemphys.2011.04.023     Document Type: Article

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